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Consideration of direct bit‐rate measuring method based on extracting envelope signal
Author(s) -
Otani Akihito,
Tsuda Yukio,
Igawa Koji,
Shida Katsunori
Publication year - 2010
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.21031
Subject(s) - synchronizing , oscilloscope , waveform , lookup table , signal (programming language) , signal generator , computer science , repeatability , electronic engineering , jitter , electrical engineering , engineering , mathematics , telecommunications , topology (electrical circuits) , radar , chip , statistics , detector , programming language
We previously developed an optical sampling oscilloscope (EDT‐OSO) based on an envelope detection triggering method. This EDT‐OSO can stably measure eye‐diagram waveforms of signals exceeding 100 Gbps without an external high‐frequency clock signal. However, far‐end waveform measurements over a long distance could not be performed because the EDT‐OSO requires the linkage of 10‐MHz time bases in the EDT‐OSO and a light under test (LUT) generator for synchronizing. To overcome this drawback we developed a direct bit‐rate measuring method for synchronizing both 10‐MHz time bases virtually and a self‐synchronized EDT‐OSO (SSEDT‐OSO) based on this method. We confirmed that the bit‐rate measurement repeatability of the SSEDT‐OSO was from 10 B9 to 10 B8 by evaluating the standard deviation, and showed that the SSEDT‐OSO can measure an eye diagram without linking to 10‐MHz time bases. This paper explains the basic principle for measuring the bit‐rate of the LUT directly. We also describe the configuration of the SSEDT‐OSO and present evaluation results. © 2010 Wiley Periodicals, Inc. Electr Eng Jpn, 173(4): 1–8, 2010; Published online in Wiley Online Library ( wileyonlinelibrary.com ). DOI 10.1002/eej.21031