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Cooperative allocation of SVR and SVC for voltage fluctuation in case of connecting distributed generators
Author(s) -
Sugimoto Junjiro,
Yokoyama Ryuichi,
Fujita Goro,
Fukuyama Yoshikazu
Publication year - 2008
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.20639
Subject(s) - limit (mathematics) , tabu search , voltage , node (physics) , computer science , control theory (sociology) , range (aeronautics) , distribution (mathematics) , mathematical optimization , engineering , topology (electrical circuits) , mathematics , electrical engineering , algorithm , control (management) , mathematical analysis , structural engineering , artificial intelligence , aerospace engineering
This paper presents a method for cooperative allocation of step voltage regulators (SVRs) and static var compensators (SVCs) when some distributed generators (DGs) are installed in a distribution system. In the proposed method, reactive tabu search (RTS) with multiple structures and functions is applied. First, the allocations of the SVRs are selected optimally and then the tap positions of the SVRs are optimized by the RTS. Finally, the locations of the SVC are chosen in order to enhance the voltage profile in the distribution network. The proposed method enables us to take account of the installation cost of both SVRs and SVCs as an economic criterion, of the upper and lower voltage limit at each node, and also of the upper limit of line currents as constraints. By applying the proposed method to a practical distribution test system (IEEE 34 Node Test Feeder Model), it is verified that this method is efficient in allocating SVRs and SVCs at minimum cost and in regulating the system voltages within an appropriate range after introducing DGs into the distribution system. © 2008 Wiley Periodicals, Inc. Electr Eng Jpn, 164(2): 10–17, 2008; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.20639