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Electron spectroscopy of organic thin‐film FETs
Author(s) -
Shimada Toshihiro
Publication year - 2005
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.20154
Subject(s) - x ray photoelectron spectroscopy , ultraviolet photoelectron spectroscopy , spectroscopy , materials science , thin film , electron , optoelectronics , electron spectroscopy , electron energy loss spectroscopy , analytical chemistry (journal) , nanotechnology , chemistry , physics , nuclear magnetic resonance , organic chemistry , quantum mechanics , transmission electron microscopy
Organic thin‐film FETs have been studied by using electron spectroscopic techniques. Ultraviolet photoelectron spectroscopy has revealed that photopolymerization is enhanced by fabricating FET structure. Energy levels and the effective mass of charge carriers are discussed based on the results of photoelectron spectroscopy and electron energy loss spectroscopy. © 2005 Wiley Periodicals, Inc. Electr Eng Jpn, 152(1): 31–36, 2005; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.20154