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Robustness of the multigrid method for edge‐based finite element analysis
Author(s) -
Watanabe Kota,
Igarashi Hajime,
Honma Toshihisa
Publication year - 2004
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.10289
Subject(s) - multigrid method , finite element method , robustness (evolution) , mathematics , convergence (economics) , distortion (music) , computer science , gauss , mesh generation , computational science , mathematical optimization , mathematical analysis , engineering , physics , partial differential equation , structural engineering , telecommunications , amplifier , biochemistry , chemistry , bandwidth (computing) , quantum mechanics , economics , gene , economic growth
The dependence of the multigrid finite element method solving three‐dimensional magnetostatic fields on the quality of the finite element mesh is reported. It is shown that the convergence of the multigrid method is strongly influenced by the mesh quality. Moreover, the multigrid method with ICCG smoother is shown to be more robust against mesh distortion than that with Gauss–Seidel and SOR smoothers. © 2004 Wiley Periodicals, Inc. Electr Eng Jpn, 148(1): 75–81, 2004; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.10289