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Contingency selection method for on‐line small signal stability monitoring
Author(s) -
Takimoto Akira,
Uchida Naoyuki
Publication year - 2003
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.10186
Subject(s) - eigenvalues and eigenvectors , nonlinear system , stability (learning theory) , selection (genetic algorithm) , contingency , electric power system , signal (programming language) , line (geometry) , transmission line , matrix (chemical analysis) , control theory (sociology) , mathematics , power (physics) , computer science , telecommunications , control (management) , physics , artificial intelligence , machine learning , linguistics , philosophy , geometry , materials science , quantum mechanics , composite material , programming language
To make greater use of existing electric power transmission facilities, security assessment utilizing on‐line data is thought to be one of the effective measures that can be taken. To realize on‐line assessment of postfault small signal stability for a number of supposed contingencies, it is effective to identify severe contingencies to be analyzed with a precise assessment program, such as the S‐method. We developed a contingency selection method that has two indices for selection. One of the indices is postfault eigenvalue estimation based on second‐order approximation of the eigenvalue change in response to system matrix change, which is effective for relatively weak nonlinear eigenvalue change. The other one is the Nonlinearity index, which indicates the strength of nonlinearity eigenvalue change. It is effective in detecting strong nonlinear eigenvalue changes that cannot be estimated correctly by second‐order approximation. Calculation results with IEEJ Bulk Power System Models show that the proposed method can effectively decrease the number of contingencies that must be analyzed by the precise Small Signal Analysis method. © 2003 Wiley Periodicals, Inc. Electr Eng Jpn, 145(4): 20–27, 2003; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.10186