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Development of a computed tomography algorithm for ion temperature measurement
Author(s) -
Murata Yukihiro,
Takeuchi Shinya,
Tawara Takeshi,
Ono Yasushi
Publication year - 2003
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.10114
Subject(s) - gaussian , algorithm , bessel function , trigonometric functions , tomography , wavelength , gaussian function , projection (relational algebra) , physics , gaussian process , boundary (topology) , optics , computational physics , mathematics , mathematical analysis , geometry , quantum mechanics
A new algorithm for 2D ion temperature measurement was developed by including Gaussian fitting of Doppler broadened spectral lines in tomography reconstruction. A modified Bessel function model and squared cosine function model were used to satisfy both the annular boundary conditions in space and the Gaussian profile of spectral lines in wavelength. This method was found much more robust against projection signal errors than the conventional Gaussian‐fitting method at each wavelength. © 2003 Wiley Periodicals, Inc. Electr Eng Jpn, 142(4): 1–8, 2003; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.10114