Premium
Chemical Analysis of Casual Elements for Deterioration of Cylindrical EDLC
Author(s) -
YOSHITAMA HIROMU,
TASHIMA DAISUKE,
SAKODA TATSUYA,
HAYASHI NORIYUKI,
YUHARA MASAMITSU,
UTSUNOMIYA TAKASHI
Publication year - 2016
Publication title -
electronics and communications in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.131
H-Index - 13
eISSN - 1942-9541
pISSN - 1942-9533
DOI - 10.1002/ecj.11911
Subject(s) - electrolyte , materials science , inductively coupled plasma , analytical chemistry (journal) , electrode , spectrum analyzer , silicon , capacitor , voltage , plasma , chemistry , electrical engineering , optoelectronics , chromatography , physics , quantum mechanics , engineering
SUMMARY Chemical analysis was carried out before and after the constant voltage hold test that was an acceleration deterioration examination to clarify deterioration factors of electric double‐layer capacitor (EDLC). The results showed that the stress test slightly caused the increase of internal resistance. It was also confirmed that the range of fluorochemicals was formed on the electrode surface for approximately 10 nm in depth using electron spectroscopy for chemical analysis (ESCA). From the chemical analysis of the electrolyte using an inductively coupling plasma emission analyzer (ICP‐OES), it was confirmed that the electrolyte included silicon which is one of the ingredient elements of an electrode and that the increase in holding voltage in the stress test decreased the silicon density in the electrolyte.