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Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules Due to IEMI
Author(s) -
HAYASHI YUICHI,
HOMMA NAOFUMI,
MIZUKI TAKAAKI,
AOKI TAKAFUMI,
SONE HIDEAKI
Publication year - 2016
Publication title -
electronics and communications in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.131
H-Index - 13
eISSN - 1942-9541
pISSN - 1942-9533
DOI - 10.1002/ecj.11855
Subject(s) - cryptography , encryption , cryptographic primitive , information leakage , cryptographic protocol , computer science , fault injection , electronic engineering , mechanism (biology) , leakage (economics) , interference (communication) , electromagnetic interference , embedded system , engineering , computer security , computer network , physics , channel (broadcasting) , software , quantum mechanics , economics , macroeconomics , programming language
SUMMARY This paper investigates the mechanism underlying faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI), which causes information leakage in electronic devices without disrupting their functions or damaging their components. We show this fault mechanism through experiments using the faulty ciphertexts and pulse injection to a specific round in the encryption process. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup time violation in the cryptographic module.