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Compilation of Cross Section Data of Elementary Processes of HCI Applicable for Plasma Modeling
Author(s) -
Efremov A. M.,
Svetsov V. I.,
Balashov D. I.
Publication year - 1999
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.2150390306
Subject(s) - cross section (physics) , excitation , plasma , atomic physics , electron , experimental data , work (physics) , townsend , physics , computer science , nuclear physics , quantum mechanics , statistics , mathematics
In this current work an cross section data for HCI elementary processes were calculated on the base of calculated and experimental data comparison on electrons drift rate and Townsend coefficients of dissociative attachment. Cross sections data of HCI electronic excitation are obtained for the first time.

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