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Similarity scaling‐application and limits for high‐efficiency‐multistage‐plasma‐thruster particle‐in‐cell modelling
Author(s) -
Matthias Paul,
Kahnfeld Daniel,
Kemnitz Stefan,
Duras Julia,
Koch Norbert,
Schneider Ralf
Publication year - 2020
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.201900199
Subject(s) - scaling , similarity (geometry) , plasma , computer science , process (computing) , kinetic energy , statistical physics , ion , particle (ecology) , particle in cell , aerospace engineering , space (punctuation) , physics , computational science , mathematics , classical mechanics , artificial intelligence , engineering , nuclear physics , geology , operating system , oceanography , geometry , quantum mechanics , image (mathematics)
Abstract To suit a wide variety of space mission profiles, different designs of ion thrusters were developed, such as the High‐Efficiency‐Multistage‐Plasma thrusters (HEMP‐T). In the past, the optimization of ion thrusters was a difficult and time‐consuming process and evolved experimentally. Because the construction of new designs is expensive, cheaper methods for optimization were sought‐after. Computer‐based simulations are a cheap and useful method towards predictive modelling. The physics in HEMP‐T requires a kinetic model. The Particle‐in‐Cell (PIC) method delivers self‐consistent solutions for the plasmas of ion thrusters, but it is limited by the high amount of computing time required to study a specific system. Therefore, it is not suited to explore a wide operational and design space. An approach to decrease computing time is self‐similarity scaling schemes, which can be derived from the kinetic equations. One specific self‐similarity scheme is investigated quantitatively in this work for selected HEMP‐Ts, using PIC simulations. The possible application of the scaling is explained and the limits of this approach are derived.