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Double‐probe measurement in recombining plasma using NAGDIS‐II
Author(s) -
Hayashi Y.,
Nishikata H.,
Ohno N.,
Kajita S.,
Tanaka H.,
Ohshima H.,
Seki M.
Publication year - 2019
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.201800088
Subject(s) - plasma , atomic physics , electrical resistivity and conductivity , thomson scattering , electron temperature , plasma diagnostics , scattering , electron density , electron , physics , electrode , laser , materials science , optics , nuclear physics , quantum mechanics
We have studied the validity of the double‐probe method in recombining plasmas. Electron temperature ( T e ) measured with a double probe was quantitatively evaluated by taking into account the influences of plasma potential fluctuation, plasma resistivity, and electron density fluctuation on the current–voltage characteristics. Differential potential fluctuation and plasma resistivity between two electrodes have a minor effect on T e especially when the inter‐distance is small (typically 1 mm). Scattering of measured T e due to the density fluctuation was sufficiently suppressed by making the data acquisition time long (typically 4 s) and taking the average. There is a good agreement between T e measured with the optimized double‐probe method and that with laser Thomson scattering diagnostics.