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Investigation of statistical behaviour of electrical breakdown voltage distribution for nitrogen‐filled diode at 13.3 mbar pressure
Author(s) -
Živanović Emilija N.,
Maluckov Čedomir A.
Publication year - 2018
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.201700191
Subject(s) - weibull distribution , materials science , breakdown voltage , randomness , voltage , diode , nitrogen , distribution function , analytical chemistry (journal) , mechanics , thermodynamics , statistics , electrical engineering , physics , mathematics , optoelectronics , chemistry , quantum mechanics , engineering , chromatography
The results of statistical analysis of the electrical breakdown voltage distribution in nitrogen are presented in this paper. For obtaining the experimental results, a nitrogen‐filled diode at 13.3 mbar pressure was used. The dynamic method was used for estimating the static breakdown voltage. One‐hundred voltage measurements were carried out for each value of the increase in the voltage rate from 1 up to 10 V/s. Wilcoxon test was used for checking the measurements' randomness for each rate. The experimental distribution functions are fitted with the three‐parameter Weibull distribution function. The coefficients of the Weibull distribution are also estimated.