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Tracing Laser‐Induced Dielectric Breakdown in Solids
Author(s) -
Rethfeld B.,
Krutsch H.,
Hoffmann D.H.H.
Publication year - 2010
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.201010005
Subject(s) - dielectric , materials science , laser , absorption (acoustics) , irradiation , electron , kinetic energy , dielectric strength , atomic physics , electron density , free electron model , electric field , condensed matter physics , optoelectronics , optics , physics , composite material , nuclear physics , quantum mechanics
Abstract We model the transient free electron density in laser‐irradiated dielectrics with a kinetic approach. The internal electrical field responsible for the strength and mechanisms of photon absorption is calculated self‐consistently in dependence on the increasing free electron density. The results show the threshold behavior of the absorbed energy, responsible for dielectric breakdown (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)