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A Phenomenological Probe Model of Fast Ion Measurement Using a Hybrid Directional Probe
Author(s) -
Nagaoka K.,
Isobe M.,
Osakabe M.,
Watanabe K. Y.,
Takeiri Y.
Publication year - 2008
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.200810077
Subject(s) - ion , ion current , saturation current , electron , atomic physics , calibration , materials science , secondary electrons , phenomenological model , thermal , yield (engineering) , physics , voltage , nuclear physics , condensed matter physics , thermodynamics , quantum mechanics , metallurgy
A phenomenological probe model was developed for quantitative fast‐ion‐measurement using a hybrid directional probe (HDP), which is a directional probe to measure ion current and heat flux at the same position. The secondary electrons due to fast‐ion‐injection onto the probe surface enhances the ion‐saturation‐current, thus a thermal probe method was required for quantitative measurement of fast ions. The model gives a simple expression of the secondary electron yield as a function of ion currents and heat fluxes measured by the HDP, and can determine the net fast‐ion‐current without the calibrations of the thermal probe method. The model was applied to the experimental results of fast‐ion‐measurements using a HDP in CHS, and the secondary electron yield obtained by the model agrees with the calibration results of the HDP. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)