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Design of a thermal probe for the plasma diagnostics
Author(s) -
Matsuura H.,
Michimoto K.
Publication year - 2004
Publication title -
contributions to plasma physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.531
H-Index - 47
eISSN - 1521-3986
pISSN - 0863-1042
DOI - 10.1002/ctpp.200410100
Subject(s) - plasma , heat flux , biasing , ion , voltage , electron temperature , materials science , thermal , work (physics) , current (fluid) , flux (metallurgy) , atomic physics , plasma parameters , temperature measurement , mechanics , thermodynamics , physics , heat transfer , nuclear physics , quantum mechanics , metallurgy
When a solid material is inserted into plasma, it receives heat flux and electrical current according to its bias voltage. The heat flux‐voltage characteristic is more complicated than the current‐voltage characteristic and depend on ion temperature as well as electron temperature. Thermal probe method uses this characteristic to determine plasma parameter. We propose here to use it to deduce ion temperature and show the results on related work. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)