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Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances
Author(s) -
Tadeusiewicz Michał,
Hałgas Stanisław,
Korzybski Marek
Publication year - 2012
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.770
Subject(s) - electronic circuit , fault (geology) , nonlinear system , computer science , analogue electronics , component (thermodynamics) , stuck at fault , point (geometry) , algorithm , linear circuit , fault detection and isolation , electronic engineering , engineering , mathematics , equivalent circuit , artificial intelligence , electrical engineering , physics , geometry , quantum mechanics , voltage , seismology , actuator , thermodynamics , geology
SUMMARY This paper deals with the diagnosis of multiple catastrophic faults, being cuts (open‐circuits) of some connecting paths and/or short‐circuits of some pairs of points in analog circuits. A method enabling us to detect and identify the faults, taking into account the deviations of the circuit parameters within their tolerance ranges, is developed. The method exploits an appropriate fault dictionary. The fault dictionary is used only for preliminary identification of the faults, because it is based on the analysis of the circuits with nominal parameters. The crucial point of the method is a verification procedure, proposed in this paper, based on the linear programming approach. It leads to the results considering the component variations within their tolerance ranges. In addition, a procedure for selecting appropriate test points, employing some evolutionary techniques, is developed. Although the approach presented in this paper is described in detail for linear circuits, it can be directly generalized to nonlinear circuits. Three numerical examples, including two linear and one nonlinear circuits, illustrate the proposed method and show its efficiency. Copyright © 2011 John Wiley & Sons, Ltd.