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Time domain sensitivity of high‐speed VLSI interconnects
Author(s) -
Liu Nelson,
Nakhla Michel,
Zhang QiJun
Publication year - 1994
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.4490220605
Subject(s) - very large scale integration , sensitivity (control systems) , interconnection , computer science , electronic engineering , time domain , network analysis , topology (electrical circuits) , engineering , electrical engineering , telecommunications , computer vision
An adjoint method based on the asymptotic wave‐form evaluation (AWE) technique is described for the time domain sensitivity analysis of VLSI interconnect networks that contain linear lumped and distributed elements. the network sensitivity, which is approximated by a set of poles and residues sensitivities, can be evaluated efficiently with respect to all network components and interconnect parameters. Owing to the recursive relationship between the time moments of distributed networks, the conventional adjoint approach could not be applied directly. Instead, an alternative approach is presented which solves this problem by introducting the concept of adjoint moments for networks with distributed elements. Examples and comparisons with the sensitivity determined by perturbation are presented. the proposed technique is useful for the identification of critical circuit elements and the performance optimization of high‐speed VLSI designs.