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Design of testability for analogue fault diagnosis
Author(s) -
Wey ChinLong
Publication year - 1987
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.4490150204
Subject(s) - testability , fault (geology) , computer science , design for testing , feature (linguistics) , prime (order theory) , electronic circuit , algorithm , reliability engineering , mathematics , engineering , electrical engineering , linguistics , philosophy , combinatorics , seismology , geology
Abstract With the rapidly increasing complexity of circuits and systems, the ability adequately to design a diagnosable circuit or system is a prime requisite for rapid fault location. In the present paper, a necessary and sufficient condition for pseudo‐circuit generation is presented for the use of the pseudo‐circuit in the self‐test algorithm. to determine the diagnosability of a designed circuit, a testability condition is presented with examples. the unique feature of these conditions is that they depend only on the topological structure of a given circuit, not on the component values; therefore, these conditions can be implemented in both linear and non‐linear circuits or systems. With the aid of a computer, the test points may be generated automatically by the proposed algorithm. Based on the proposed algorithm, the design of testability can be established.