z-logo
Premium
Analytical properties of mos transistor characteristics
Author(s) -
Somogyi Antal J.
Publication year - 1982
Publication title -
international journal of circuit theory and applications
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.4490100206
Subject(s) - citation , library science , computer science

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom