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Realization of n ‐port resistance matrices
Author(s) -
Lal M.,
Jain N. C.
Publication year - 1973
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.4490010111
Subject(s) - realization (probability) , resistive touchscreen , port (circuit theory) , topology (electrical circuits) , matrix (chemical analysis) , mathematics , computer science , engineering , electronic engineering , electrical engineering , combinatorics , statistics , materials science , composite material
The problem of realization of a given real symmetric matrix R of order n as an open‐circuit resistance matrix of some resistive n ‐port network having nullity n is considered in this paper. The solution presented is in the form of a realization technique which implies the necessary and sufficient conditions for this type of realization. Derived from fundamental topological considerations in the analysis of resistive n ‐port networks, the realization technique presented here is found to be superior to the existing ones.