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Voltage stress analysis of a single switch high boost converter with mixed CCM‐DCM mode useful for snubber design
Author(s) -
Roy Choudhury Tanmoy,
Nayak Byamakesh,
Santra Subhendu Bikash
Publication year - 2018
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.2511
Subject(s) - snubber , inductor , voltage , duty cycle , flyback transformer , realization (probability) , stress (linguistics) , flyback converter , electronic engineering , mode (computer interface) , engineering , electrical engineering , computer science , capacitor , boost converter , transformer , mathematics , linguistics , statistics , philosophy , operating system
Summary In this paper, a novel analysis of a single switch boost‐flyback integrated DC‐DC converter is accomplished under mixed CCM‐DCM mode operation. Because of the impact of reverse recovery during CCM‐DCM mode operation, a large voltage stress appears on the devices in comparison with CCM‐CCM operation. The devices are required to be saved from the attack of such stresses with a proper snubber design. Thus, a complete realization of the voltage stress on the devices, required for effective snubber parameter design, is carried out in this article. Further, the effect of voltage stress on the devices under different mode of operation with variation in duty ratio and/or variation in coupled inductor energy releasing period is analyzed. Validation of this study is carried out with a prototype of 50 W capacity, operated with light load conditions to attain CCM‐DCM mode effectively.