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X‐ray micrographic imaging system based on COTS CMOS sensors
Author(s) -
Alcalde Bessia Fabricio,
Pérez Martin,
Lipovetzky José,
Piunno Natalia Alejandra,
Mateos Horacio,
Sidelnik Iván,
Blostein Juan Jerónimo,
Sofo Haro Miguel,
Gómez Berisso Mariano
Publication year - 2018
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.2502
Subject(s) - scintillator , photon , detector , image resolution , cmos , image sensor , optics , physics , cmos sensor , x ray detector , photon counting , attenuation , optoelectronics , materials science , computer science
Summary This paper presents the use of commercial off the shelf CMOS image sensors for the acquisition of X‐ray images with high spatial resolution. The X‐ray images, with application in biology, electronic components inspection, and paleontology research, are obtained with 8‐keV photons from a Cu tube. The quantum efficiency of the detector is estimated using attenuation lengths of photons in the sensor and compared to traditional scintillator conversion layers. The spatial resolution observed with the sensor is limited by the charge redistribution produced after photon interaction with Si.