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A 0.008‐mm 2 , 35‐μW, 8.87‐ps‐resolution CMOS time‐to‐digital converter using dual‐slope architecture
Author(s) -
Kim Yeomyung,
Shon Doohyun,
Kim Tae Wook
Publication year - 2017
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.2272
Subject(s) - linearity , cmos , time to digital converter , capacitor , voltage , current source , least significant bit , electronic engineering , output impedance , integrating adc , successive approximation adc , electrical engineering , physics , computer science , engineering , ćuk converter , electronic circuit , clock signal , operating system
Summary This paper presents a high resolution time‐to‐digital converter (TDC) for low‐area applications. To achieve both high resolution and low circuit area, we propose a dual‐slope voltage‐domain TDC, which is composed of a time‐to‐voltage converter (TVC) and an analog‐to‐digital converter (ADC). In the TVC, a current source and a capacitor are used to make the circuit as simple as possible. For the same reason, a single‐slope ADC, which is commonly used for compact area ADC applications, is adapted and optimized. Because the main non‐linearity occurs in the current source of the TVC and the ramp generator of the ADC, a double gain‐boosting current source is applied to overcome the low output impedance of the current source in the sub‐100‐nm CMOS process. The prototype TDC is implemented using a 65‐nm CMOS process, and occupies only 0.008 mm 2 . The measurement result shows a dynamic range with an 8‐bit 8.86‐ps resolution and an integrated non‐linearity of ±1.25 LSB. Copyright © 2016 John Wiley & Sons, Ltd.