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Analysis of flicker noise conversion to phase noise in CMOS differential LC oscillators
Author(s) -
Nikpaik Amir,
Nabavi Abdolreza
Publication year - 2016
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.2083
Subject(s) - flicker noise , phase noise , noise (video) , flicker , noise generator , burst noise , noise temperature , electronic engineering , effective input noise temperature , shot noise , cmos , physics , electrical engineering , noise floor , noise reduction , noise figure , acoustics , engineering , noise measurement , computer science , amplifier , artificial intelligence , image (mathematics) , detector
Summary An analysis of the flicker noise conversion to close‐in phase noise in complementary metal‐oxide semiconductor (CMOS) differential inductance‐capacitance ( LC )‐voltage controlled oscillator is presented. The contribution of different mechanisms responsible for flicker noise to phase noise conversion is investigated from a theoretical point of view. Impulse sensitivity function theory is exploited to quantify flicker noise to phase noise conversion process from both tail and core transistors. The impact of different parasitic capacitances inside the active core on flicker noise to phase noise conversion is investigated. Also, it is shown how different flicker noise models for core metal‐oxide semiconductor (MOS) transistors may result in different close‐in phase noise behaviors. Based on the developed analysis, design guidelines for reducing the close‐in phase noise are introduced. Copyright © 2015 John Wiley & Sons, Ltd.