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Survey of integrated‐circuit‐oscillator phase‐noise analysis
Author(s) -
Pankratz Erik,
SánchezSinencio Edgar
Publication year - 2014
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.1890
Subject(s) - phase noise , flicker noise , noise (video) , quantum noise , electronic engineering , variable frequency oscillator , computer science , vackář oscillator , oscillator phase noise , electrical engineering , topology (electrical circuits) , physics , engineering , local oscillator , noise figure , quantum mechanics , quantum , cmos , amplifier , artificial intelligence , image (mathematics)
This tutorial distills the salient phase‐noise analysis concepts and key equations developed over the last 75 years relevant to integrated circuit oscillators. Oscillator phase and amplitude fluctuations have been studied since at least 1938 when Berstein solved the Fokker–Planck equations for the phase/amplitude distributions of a resonant oscillator. The principal contribution of this work is the organized, unified presentation of eclectic phase‐noise analysis techniques, facilitating their application to integrated circuit oscillator design. Furthermore, we demonstrate that all these methods boil down to obtaining three things: (1) noise modulation function; (2) noise transfer function; and (3) current‐controlled oscillator gain. For each method, this paper provides a short background explanation of the technique, a step‐by‐step procedure of how to apply the method to hand calculation/computer simulation, and a worked example to demonstrate how to analyze a practical oscillator circuit with that method. This survey article chiefly deals with phase‐noise analysis methods, so to restrict its scope, we limit our discussion to the following: (1) analyzing integrated circuit metal–oxide–semiconductor/bipolar junction transistor‐based LC, delay, and ring oscillator topologies; (2) considering a few oscillator harmonics in our analysis; (3) analyzing thermal/flicker intrinsic device‐noise sources rather than environmental/parametric noise/wander; (4) providing mainly qualitative amplitude‐noise discussions; and (5) omitting measurement methods/phase‐noise reduction techniques. Copyright © 2013 John Wiley & Sons, Ltd.