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Improvement of the contraction‐type LP test algorithm for finding all solutions of piecewise‐linear resistive circuits
Author(s) -
Yamamura Kiyotaka,
Tanaka Shigeru
Publication year - 2001
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/cta.159
Subject(s) - resistive touchscreen , piecewise linear function , contraction (grammar) , algorithm , mathematics , piecewise , electronic circuit , computer science , mathematical analysis , engineering , electrical engineering , medicine , computer vision
In this letter, an effective technique is proposed for improving the computational efficiency of the contraction‐type LP test algorithm, which is an algorithm for finding all solutions of piecewise‐linear resistive circuits. Using the proposed technique, all solutions of a large‐scale problem, where the number of variables is 100 and the number of linear regions is 10 100 , could be found in less than 10 min using a 360 MHz computer. Copyright 2001 John Wiley & Sons, Ltd.