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High‐Throughput Screening of Thin‐Film Semiconductor Material Libraries I: System Development and Case Study for TiWO
Author(s) -
Sliozberg Kirill,
Schäfer Dominik,
Erichsen Thomas,
Meyer Robert,
Khare Chinmay,
Ludwig Alfred,
Schuhmann Wolfgang
Publication year - 2015
Publication title -
chemsuschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.412
H-Index - 157
eISSN - 1864-564X
pISSN - 1864-5631
DOI - 10.1002/cssc.201402917
Subject(s) - photocurrent , thin film , materials science , monochromator , semiconductor , electrode , optoelectronics , optical fiber , capillary action , optics , analytical chemistry (journal) , wavelength , nanotechnology , chemistry , composite material , physics , chromatography
An automated optical scanning droplet cell (OSDC) enables high‐throughput quantitative characterization of thin‐film semiconductor material libraries. Photoelectrochemical data on small selected measurement areas are recorded including intensity‐dependent photopotentials and ‐currents, potentiodynamic and potentiostatic photocurrents, as well as photocurrent (action) spectra. The OSDC contains integrated counter and double‐junction reference electrodes and is fixed on a precise positioning system. A Xe lamp with a monochromator is coupled to the cell through a thin poly(methyl methacrylate) (PMMA) optical fiber. A specifically designed polytetrafluoroethylene (PTFE) capillary tip is pressed on the sample surface and defines through its diameter the homogeneously illuminated measurement area. The overall and wavelength‐resolved irradiation intensities and the cell surface area are precisely determined and calibrated. System development and its performance are demonstrated by means of screening of a TiWO thin film.