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Stereometrical X‐ray Interferometric Diffraction Topography of Crystal Imperfection
Author(s) -
Aboyan A. O.
Publication year - 1996
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170310417
Subject(s) - interferometry , astronomical interferometer , diffraction , optics , displacement (psychology) , deformation (meteorology) , crystal (programming language) , displacement field , moiré pattern , field (mathematics) , physics , materials science , computer science , mathematics , psychology , finite element method , meteorology , psychotherapist , pure mathematics , thermodynamics , programming language
A method for X‐ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that by means of double and triple interferometers it is possible to detect segregation lines, displacement lines, and the Moiré patterns of different type imperfections as well.