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X‐ray Photoelectron Spectroscopic Studies of Sellinite and Eulytite BGO and BSO Crystals
Author(s) -
Gopalakrishnan R.,
Gopinath C. S.,
Ramasamy P.
Publication year - 1996
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170310221
Subject(s) - x ray photoelectron spectroscopy , ionic bonding , x ray , crystallography , covalent bond , materials science , spectral line , oxygen , analytical chemistry (journal) , ion , chemistry , optics , physics , nuclear magnetic resonance , organic chemistry , astronomy , chromatography
Single crystals of Bi 12 GeO 20 , Bi 12 SiO 20 , Bi 4 Ge 3 O 12 , and Bi 4 Si 3 O 12 are grown by Floating zone and Czochralski techniques. The X‐ray photoelectron spectroscopic (XPS) studies have been carried out on BSO and BGO crystals. XPS is employed to characterise the surface quality and bulk nature of the crystals. The surface contamination on both types of crystals are identified. In addition to the contamination, some amount of Bi atoms are observed with Bi ions on sellinite. It is demonstrated that the eulytite crystals are chemically more robust to degradation than the sellinite crystals. The predominant covalent and ionic character of Bi 4 Ge 3 O 12 and Bi 4 Si 3 O 12 respectively is explained from their oxygen 1s core level spectra.