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Interface Shape Studies for Fluoride‐ and Silicon Rods Grown by the E.F.G. Method
Author(s) -
Nicoara Irina,
Vizman Daniel
Publication year - 1995
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170300812
Subject(s) - rod , interface (matter) , materials science , silicon , enhanced data rates for gsm evolution , thermal conductivity , conductivity , fluoride , chemical engineering , crystallography , mineralogy , composite material , chemistry , inorganic chemistry , optoelectronics , computer science , engineering , medicine , alternative medicine , pathology , capillary number , capillary action , telecommunications
The influence of the die geometry and of the thermal conductivity of materials on the solid‐liquid interface shape in Edge‐defined Film‐fed Growth has been studied.
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