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X‐ray investigations on the defect structure of KCl with Cd ++ impurities
Author(s) -
Saravanan R.,
Mohanlal S. K.
Publication year - 1995
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170300111
Subject(s) - impurity , lattice constant , analytical chemistry (journal) , diffraction , bravais lattice , vacancy defect , chemistry , x ray , x ray crystallography , intensity (physics) , materials science , crystallography , crystal structure , optics , physics , organic chemistry , chromatography
A systematic defect characterization by X‐ray diffraction was carried out on crystalline KCl system with Cd ++ impurities at various levels, viz. 2, 4, 6, 8, and 10 mole%. Quantitative estimation of the amount and nature of defects was done from the integrated X‐ray intensity measurements of the samples. Further analyses of the experimental data indicate enhancement of the Debye‐Waller factor with concentration of Cd ++ impurities. The measured density and the cell constant values at room temperature yield vacancy estimations for the system. The observed change of Bravais lattice of the system for Cd ++ concentrations from 4 mole% with appreciable enhancement of intensity of Bragg reflections of mixed indices are reported and discussed.