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Imaging crystal growth features using scanning force microscopy (SFM)
Author(s) -
Kipp S.,
Kämmer S.,
Lacmann R.,
Rolfs J.,
Tanneberger U.,
Beckmann W.
Publication year - 1994
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170290716
Subject(s) - scanning force microscopy , microscopy , materials science , scanning probe microscopy , scanning ion conductance microscopy , atomic force microscopy , scanning confocal electron microscopy , crystallography , nanotechnology , optics , chemistry , physics
Crystal growth features on stearic acid, potassium nitrate, and potash alum have been determined by means of scanning force microscopy (SFM). Structures like growth spirals, etch pits, 2D‐nuclei, and growth hillocks could be observed. The analysis of the face specific surface topographies leads to structures which correspond to those expected from kinetic measurements.