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DAFS experiments for the determination of ordering on different {111} planes in epitaxial GaInP/GaAs layers
Author(s) -
Meyer D. C.,
Richter K.,
Paufler P.,
Krane H.G.
Publication year - 1994
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170290428
Subject(s) - physics , crystallography , philosophy , chemistry
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