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X‐ray diffraction studies on the core part of the Czochralski‐grown Bi 12 SiO 20 crystal
Author(s) -
Hengyong Tu,
Xuewu Xu,
Jingying Liao
Publication year - 1994
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170290334
Subject(s) - chinese academy of sciences , library science , citation , china , geography , computer science , archaeology