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Growth and Characterisation of Pure and Nickel‐doped Strontium Tartrate Tetrahydrate Single Crystals
Author(s) -
Rethinam F. Jesu,
Oli D. Arivu,
Ramasamy S.,
Ramasamy P.
Publication year - 1993
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170280616
Subject(s) - tetrahydrate , strontium , thermogravimetric analysis , tartrate , nickel , doping , etching (microfabrication) , atomic absorption spectroscopy , materials science , nuclear chemistry , inorganic chemistry , chemistry , analytical chemistry (journal) , crystallography , nanotechnology , crystal structure , metallurgy , organic chemistry , physics , optoelectronics , layer (electronics) , quantum mechanics
Strontium tartrate tetrahydrate single crystals doped with nickel have been grown in silica gel. The grown crystals have been characterized by X‐ray, atomic absorption spectroscopy (AAS), thermogravimetric analysis (TGA), and etching technique.