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New Temperature Control Apparatus for X‐ray Experiments
Author(s) -
Kobayashi H.,
Nakamura N.
Publication year - 1993
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170280524
Subject(s) - small angle x ray scattering , pid controller , temperature control , detector , x ray , materials science , scattering , controller (irrigation) , proportional counter , analytical chemistry (journal) , phase transition , phase (matter) , position (finance) , chemistry , thermodynamics , optics , physics , chromatography , agronomy , organic chemistry , finance , biology , economics
A temperature control apparatus for X‐ray experiments for organic compounds was newly designed. It is a gas furnace system equipped with a proportional integrated differential (PID) controller. In this study, a position sensitive proportional counter (PSPC) was used as a detector in order to make quick measurements. Using this apparatus, the long spacing of 1‐octadecanol was measured by the small angle X‐ray scattering (SAXS) method. The long spacings of 1‐octadecanol in the high temperature phase and the low temperature stable one were 48.7 and 41.7 Å, respectively. The result obtained was consistent with that reported. It was confirmed that the apparatus designed here operated properly for the temperature control of organic compounds in X‐ray experiments and was useful for the structural study on the phase transition of organic samples.