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X‐ray Topographic Defects' Contrast on Synthetic Quartz
Author(s) -
Chirilă R.,
Csiki Z.
Publication year - 1993
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170280507
Subject(s) - quartz , displacement (psychology) , x ray , contrast (vision) , crystal growth , asymmetry , crystallography , crystallographic defect , mineralogy , materials science , crystal (programming language) , geology , optics , chemistry , composite material , physics , computer science , psychology , programming language , quantum mechanics , psychotherapist
Abstract In the present study the linear defects in several synthetic quartz have been surveyed by X‐ray topography using Lang method. The grown‐in dislocations produced by layers displacement around holes, precipitates or inclusions are discussed. Each growth zone is described with their own defects pattern and some correlations with the external morphology of the crystal are stated. There are also pointed out the asymmetry of the defects for every growth zone and the specific role in the growth mechanism of the s‐growth zone. In the final part of the work there are outlined the general and the specific conclusions.