Premium
Characteristic Growth Features and Etching of InBi Single Crystals
Author(s) -
Pandya G. R.,
Vyas S. M.
Publication year - 1993
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170280207
Subject(s) - stereographic projection , cleavage (geology) , etching (microfabrication) , materials science , crystallography , single crystal , mineralogy , chemistry , composite material , geometry , mathematics , layer (electronics) , fracture (geology)
The characteristic growth features observed on the top free surface of InBi single crystals grown by the zone‐melting method are reported. These features are analysed by stereographic technique and a possible mechanism responsible for the appearance of the characteristic growth features is discussed. A new etchant capable of revealing dislocations inclined to the cleavage plane is also reported.