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Growth and Morphology of Hollow Bi 2 Te 3 Whiskers by Physical Vapour Deposition Method
Author(s) -
Kunjomana A. G.,
Mathai Elizabeth
Publication year - 1992
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170270308
Subject(s) - whisker , whiskers , vapour deposition , bismuth telluride , materials science , chemical vapor deposition , deposition (geology) , physical vapor deposition , morphology (biology) , bismuth , crystal growth , monocrystalline whisker , chemical engineering , mineralogy , nanotechnology , crystallography , chemistry , composite material , metallurgy , thin film , thermal conductivity , paleontology , thermoelectric materials , genetics , sediment , engineering , biology
Hollow crystals of bismuth telluride have been grown by the physical vapour deposition (PVD) method. Whisker crystals as long as 10 mm have been grown and were identified by X‐ray analysis. The possible mechanism for the growth of hollow whiskers has also been suggested.