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Correlation and Multivariate Dependencies in the X‐ray Characterization of Cr, Al‐ZSM‐5 Type Zeolites
Author(s) -
Marcusson P.,
Kosslick H.,
Maess B.,
Szulzewski K.
Publication year - 1992
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170270215
Subject(s) - crystallinity , characterization (materials science) , zeolite , zsm 5 , diffraction , multivariate statistics , x ray , materials science , x ray crystallography , crystallography , mineralogy , chemistry , analytical chemistry (journal) , physics , mathematics , nanotechnology , optics , catalysis , organic chemistry , statistics
For an earlier described zeolite synthesis (Kosslick et al.) X‐ray diffraction measurements were done. The relations between the intensities of X‐ray peaks and background to other characterizing parameters were analyzed using statistical methods. it was found that the X‐ray data are a “fingerprint” of the synthesized zeolites, because the crystallinity and structure influences many other properties of the samples. Therefore, the used X‐ray data allow a comprehensive characterization of the synthesis products.