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Structure of Polycrystalline Cu Films as Solar Selective Coatings
Author(s) -
Ramadan A. A.,
AbdelRaheem S. K.,
ElShabiny A. M.,
Kaid M. F.
Publication year - 1992
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170270110
Subject(s) - crystallite , materials science , texture (cosmology) , substrate (aquarium) , amorphous solid , deposition (geology) , thin film , diffraction , composite material , crystallography , optics , metallurgy , nanotechnology , chemistry , physics , artificial intelligence , sediment , computer science , biology , paleontology , oceanography , image (mathematics) , geology
Copper thin films (5–150 nm) were prepared by vacuum deposition with different rates (0.7, 1.5 and 3 nm/s). The position, intensity and profile of X‐ray diffraction lines were analysed to study the phases, the crystallographic preferred orientation as well as the residual strain and crystallite size. The fcc polycrystalline Cu phase was revealed and no oxide phases were identified. The films were highly oriented with 〈111〉 fiber texture. The ratio of P 111 / P 200 increased with the film thickness. Thus, in case of amorphous substrate, the type of the crystallographic texture of a film depends mainly on the structure of the deposited material. The crystallite size increases while the residual strain decreases, as the film thickness or the deposition rate is increased. The crystallite size was very small compared with the film thickness. The effect of deposition rate was pronounced specially from 0.7 to 1.5 nm/s.