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X‐ray diffraction by disordered lamellar structures. Theory and Applications to Microdivided Silicates and Carbons. Springer‐Verlag, Berlin‐Heidelberg‐New York 1990, 371 Seiten mit 156 Abbildungen. 30 Tabellen und ca. 250 Literaturzitaten, Preis: 268,–DM
Author(s) -
Drits V. A.,
Tchoubar C.,
Klimanek P.
Publication year - 1991
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170260727
Subject(s) - lamellar structure , materials science , engineering physics , crystallography , physics , library science , chemistry , computer science