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Structural imperfections of crystals as a result of ion implantation
Author(s) -
Aboyan A. O.,
Bezirganyan P. A.,
Bezirganyan S. E.,
Grigoryan A. M.,
Tumasyan A. S.
Publication year - 1990
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170251210
Subject(s) - astronomical interferometer , diffraction , ion , crystal (programming language) , optics , plane (geometry) , physics , materials science , ion implantation , crystallography , interferometry , condensed matter physics , chemistry , geometry , quantum mechanics , mathematics , computer science , programming language
The diffraction of X‐rays has been studied in two‐crystal interferometers, the crystals of which had equal interplanar distances and between the blocks of which a non‐diffracting zone was formed as a result of ion implantation. Also the X‐ray diffraction was studied in two‐crystal interferometers, the interplanar distances of which were different and the non‐diffracting zone between the crystals had zero width. It was shown in plane wave approximation that the Moiré patterns should not be formed in case of former interferometers and necessarily arose with the latter type interferometers.