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Formation of high resolution X‐ray diffraction pictures of crystal imperfections, their distortionless detection and unique interpretation
Author(s) -
Bezirganyan P. H.,
Aboyan A. O.,
Khzardzhyan A. A.
Publication year - 1990
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170251012
Subject(s) - diffraction , resolution (logic) , interpretation (philosophy) , projection (relational algebra) , optics , high resolution , crystal (programming language) , x ray , materials science , physics , computer science , algorithm , artificial intelligence , geology , remote sensing , programming language
A method of step‐by‐step scanning, free from all the deficiencies inherent in the known methods of projection topography is proposed. The proposed method allows one to detect high resolution, distortionless X‐ray diffraction pictures.