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Reversible and irreversible field‐induced deformations in planar and weakly‐tilted smectic C phases
Author(s) -
Pelzl G.,
Schiller P.,
Demus D.
Publication year - 1990
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170250220
Subject(s) - schlieren , planar , condensed matter physics , texture (cosmology) , hysteresis , electric field , field (mathematics) , dielectric , materials science , boundary (topology) , optics , physics , optoelectronics , mathematics , mathematical analysis , computer graphics (images) , quantum mechanics , artificial intelligence , computer science , pure mathematics , image (mathematics)
It was found that the dielectric reorientation of planar or weakly‐tilted S c phases can take place by domain wall motion accompanied by hysteresis effect. For special boundary conditions the field‐induced deformations can become irreversible. At high electric fields an irreversible transition of a planar texture into a schlieren texture is observed. The experimental results are interpreted threoretically.