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Electron microscopic investigations on optical oxide single crystal
Author(s) -
Malicskó L.
Publication year - 1990
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170250217
Subject(s) - reflection (computer programming) , materials science , single crystal , optics , scanning electron microscope , laser , transmission electron microscopy , electron , electron diffraction , irradiation , oxide , doping , scanning transmission electron microscopy , diffraction , optoelectronics , chemistry , crystallography , nanotechnology , physics , quantum mechanics , computer science , nuclear physics , programming language , metallurgy
Scanning and transmission electron microscopic methods including energy dispersive X‐ray spectrometry and reflection high energy electron diffraction as well, were used for the inspection of the growth, the shape‐processing and the laser irradiation induced defects in pure and doped optical oxyde single crystals. Some general results will be presented and discussed in the light of theoretical predictions.