X‐ray studies of thermal expansion and phase transitions in (NH 4 ) 2 SbF 5  crystals | Zendy

Waśkowska A. | Zendy; Czapla Z. | Zendy

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X‐ray studies of thermal expansion and phase transitions in (NH 4 ) 2 SbF 5 crystals

Author(s) -

Waśkowska A.,

Czapla Z.

Publication year - 1989

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170241214

Subject(s) - diffractometer , phase transition , thermal expansion , phase diagram , diffraction , crystallography , tensor (intrinsic definition) , x ray , phase (matter) , materials science , thermal , thermodynamics , chemistry , physics , crystal structure , optics , mathematics , geometry , organic chemistry

X‐ray diffraction studies of phase transitions in (NH 4 ) 2 SbF 3 single crystals have been made by using the Bond‐type diffractometer for high‐precision measurements of the unit‐cell dimensions in a function of temperature. The principal linear thermal expansion coefficients and the linear Eulerian strain tensor have been calculated in the temperature interval 110 – 298 K. The phase transition diagram was proposed and the sequence of the phases has been compared with the results of other experimental techniques (NMR, NQR, DTA, electrophysical methods).

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