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A new technique for carrying out real‐time measurements of crystal growth rate
Author(s) -
Dong J. C.,
Yu X. L.,
Jiang H. Z.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170241105
Subject(s) - metering mode , simple (philosophy) , diffraction , crystal growth , laser , growth rate , materials science , crystal (programming language) , optics , computer science , chemistry , crystallography , physics , mathematics , geometry , philosophy , programming language , epistemology
The growth rates of crystal interfaces have been measured by using a new technique — the laser diffraction metering technique. It is simple, visualized, fast and has high precision. This paper describes the basic principle, operation method and the precision of the technique.