Premium
Morphology of TiN whiskers
Author(s) -
Wokulski Z.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170241102
Subject(s) - whiskers , tin , whisker , titanium nitride , materials science , substrate (aquarium) , morphology (biology) , crystallization , stoichiometry , optical microscope , scanning electron microscope , crystallography , chemical engineering , mineralogy , composite material , nitride , metallurgy , chemistry , layer (electronics) , oceanography , biology , engineering , genetics , geology
Crystallization of titanium nitride was conducted by the CVD method in a temperature range from 950 to 1450 °C using a TiCl 4 + N 2 + H 2 gas mixture. The influence of type of substrate used on the growth on TiN whiskers was studied. It was ascertained that the growth of TiN whiskers took place at a substrate temperature T ≧ 1200 °C. On the basis of optical microscope and SEM observations and also of X‐ray examination and measurement of angles using an optical reflection goniometer, a detailed description was made of the observed TiN whiskers growth forms. It was found that [111], [110] and [001] whiskers exhibit tip shapes that are characteristic of the given orientation. From the Hartman PBC theory the nature of the faces occurring was determined. It was also shown that the most important is the {111} F face. The stoichiometric composition of the TiN whiskers obtained was estimated and it was ascertained that these whiskers have a composition from Ti 0.98 to TiN 0.993 .