Premium
X‐ray two‐crystal diffractometer for testing of plane analyser crystals
Author(s) -
Dressler L.,
Wehrhan O.,
Uhlig I.,
Gütt R.
Publication year - 1989
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170240916
Subject(s) - diffractometer , analyser , crystal (programming language) , materials science , plane (geometry) , crystallography , x ray , surface (topology) , optics , mosaic , crystal structure , physics , chemistry , geometry , computer science , mathematics , geography , programming language , archaeology
Abstract A two‐crystal diffractometer (TCD) for testing the mosaic structure of LiF crystals is presented. Peculiarities are the adapted sensivity (angular minutes), short measuring times, large registered areas and the possibility of application for various kinds of surface treatment.