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X‐ray two‐crystal diffractometer for testing of plane analyser crystals
Crystal Research And TechnologyPeer ReviewedDressler L. +31989Journals
A two‐crystal diffractometer (TCD) for testing the mosaic structure of LiF crystals is presented. Peculiarities are the adapted sensivity (angular minutes), short measuring times, large registered areas and the possibility of application for various kinds of surface treatment.
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